ICP-OES is an analytical method for the determination of elements in the concentration range from μg/l to g/l.
The Agilent 5100 ICP-OES is configurated as a vertical dual view (VDV). By using a vertically arranged torch is it possible to observe the plasma in both directions axial and radial. The simultaneous measurement of all elements of interest enables a short measurement time. This allows an application with a high sample throughput and the processing of samples in a very small volume range as well.
The software offers several options for background correction. The Fast Automated Curve-fitting Technique (FACT) is particularly suited for interference correction of complex spectra. The spectrometer could be calibrated by using single or multi-element standard solutions as external calibration or by using an analyte addition.
The 5110 ICP-OES is utilized for the determination of major and trace elements in geological sample material, acidic and aqueous sample solutions. The sample to be analysed needs to be measured as liquid. Solid sample material is initially dissolved by using a suitable digestion process.
Agilent 5100 ICP-OES VDV (vertical dual view)