X-Ray Powder diffraction is a non-destructive technique for phase- and Rietveld analysis of crystalline materials.
Our powder X-Ray diffractometer (Empyrean, PANalytical (Almelo, Nl)) is working in reflection (Bragg-Brentano) or transmission theta-theta geometry. It is equipped with a Cu tube, a fast PIXcel-1d detector and an automatic 30-position autosampler.
Additional XRD accessories allow to perform various types of measurements:
- Sample holder with 0-background (Si-single crystal-holder) for small amount of samples
- Kapton-film cover for transmission mode for plastic foils or polymers
- ProgrammableXYZ-solid sample stage for sample positioning and 1d mapping
- Capillary spinner for air-sensitive and highly texturated samples
The instrument runs the X´Pert DataCollector and HighScorePlus software suite for phase and Rietveld analysis, including the ICSD and PDF3 database.