X-ray diffraction (XRD)

Photo: Institut of Geosciences

XRD-Lab for X-Ray powder diffraction

X-Ray Powder diffraction is a non-destructive technique for phase- and Rietveld analysis of crystalline materials.

Determination of:

  • Detailed phase composition
  • Quantitative Rietveld analysis
  • Nanocrystallite-sizes
  • Lattice parameters
  • Amorphous content
  • 1d-Mappings

Our powder X-Ray diffractometer (Empyrean, PANalytical (Almelo, Nl)) is working in reflection (Bragg-Brentano) or transmission theta-theta geometry. It is equipped with a Cu tube, a fast PIXcel-1d detector and an automatic 30-position autosampler.

Additional XRD accessories allow to perform various types of measurements:

- Sample holder with 0-background (Si-single crystal-holder) for small amount of samples

- Kapton-film cover for transmission mode for plastic foils or polymers

- ProgrammableXYZ-solid sample stage for sample positioning and 1d mapping

- Capillary spinner for air-sensitive and highly texturated samples

The instrument runs the X´Pert DataCollector and HighScorePlus software suite for phase and Rietveld analysis, including the ICSD and PDF3 database.

Photo: Institut of Geosciences



Institute of Geosciences
Campus Golm
Karl-Liebknecht-Str. 24-25
14476 Potsdam-Golm
Building 27, Room 0.40