X-ray diffraction (XRD)

XRD-Lab for X-Ray powder diffraction

X-Ray Powder diffraction is a non-destructive technique for phase- and Rietveld analysis of crystalline materials.

Determination of:

• Detailed phase composition
• Quantitative Rietveld analysis
• Nanocrystallite-sizes
• Lattice parameters
• Amorphous content
• 1d-Mappings

Our powder X-Ray diffractometer (Empyrean, PANalytical (Almelo, Nl)) is working in reflection (Bragg-Brentano) or transmission theta-theta geometry. It is equipped with a Cu tube, a fast PIXcel-1d detector and an automatic 30-position autosampler.

Additional XRD accessories allow to perform various types of measurements:

- Sample holder with 0-background (Si-single crystal-holder) for small amount of samples

- Kapton-film cover for transmission mode for plastic foils or polymers

- ProgrammableXYZ-solid sample stage for sample positioning and 1d mapping

- Capillary spinner for air-sensitive and highly texturated samples

The instrument runs the X´Pert DataCollector and HighScorePlus software suite for phase and Rietveld analysis, including the ICSD and PDF3 database.